Buck Converter Fact Sheet

reference sheet · synchronous buck

Buck Converter Fact Sheet

Every parameter that moves efficiency, ripple, transient response, stability, EMI and thermals in a buck converter, with the equations, the trade-offs, and a worked 48 V → 12 V design. The worked numbers and the calculator use representative 100 V-class silicon values; swap in datasheet values for a real design.

01Operating principle

A buck chops the input with a high-side switch, then an LC low-pass filter averages the switch-node square wave. In steady state the inductor's volt-seconds balance to zero each cycle, which sets the duty cycle: ideally D = Vout/Vin.

Conduction modes

  • CCM: inductor current never reaches zero. D is set by Vout/Vin and losses, independent of load to first order. Fixed-frequency, predictable spectrum.
  • DCM: current reaches zero and stays there. D now depends on load; the power stage becomes a first-order system (easier loop, worse regulation of D). Ringing between L and Coss on the switch node during the idle time.
  • BCM / CrM: on the boundary, valley = 0. Used in some variable-frequency controllers for soft turn-on.
  • FCCM with negative current: sync buck at light load. Clean, fixed frequency and good transient, but circulating current costs efficiency.

Synchronous vs asynchronous

  • Async (Schottky low side): loss ≈ Vf·Iout·(1−D). At 12 V out, 0.5 V × 8 A × 0.75 = 3 W; prohibitive. Fine for low current, high Vout, or where a diode's simplicity wins.
  • Sync (MOSFET low side): loss ≈ I2RDS(on)(1−D) plus dead-time and Qrr. Needs a driver, dead-time control and shoot-through protection.
  • Low Vout makes (1−D) large, so the low-side switch carries most of the current for most of the period. This is why sync rectification dominates point-of-load design.

02Core design equations

CCM, steady state. Ts = 1/fsw. r = ΔIL/Iout is the current ripple ratio.

Duty cycle (ideal)D = V_out / V_inFrom volt-second balance on L.
Duty cycle (with losses)D ≈ (V_out + I·R_LS) / (V_in − I·R_HS + I·R_LS)R includes RDS(on), DCR share, trace. D rises with load; the loop corrects it.
Async dutyD ≈ (V_out + V_f) / (V_in − V_sw + V_f)Vf is the diode drop.
Inductor rippleΔI_L = (V_in − V_out)·D / (L·f_sw) = V_out(1−D)/(L·f_sw)Worst case at Vin,max.
Inductance for target rL = V_out(1 − V_out/V_in,max) / (r·I_out·f_sw)r = 0.2–0.4 is the usual sweet spot; ≈0.4 minimizes inductor stored energy (size).
Peak / valley currentI_pk = I_out + ΔI_L/2 ; I_v = I_out − ΔI_L/2Ipk sets Isat, current-limit and FET turn-off loss. Add load-transient overshoot.
Inductor RMSI_L,rms = I_out·√(1 + r²/12)r = 0.35 adds only 1% over Iout.
High-side RMSI_HS,rms = I_out·√(D·(1 + r²/12))Conduction loss in Q1.
Low-side RMSI_LS,rms = I_out·√((1−D)·(1 + r²/12))Conduction loss in Q2.
Input cap RMSI_Cin,rms ≈ I_out·√(D(1−D))Maximum Iout/2 at D = 0.5. Size Cin for this, not for capacitance.
Output cap RMSI_Cout,rms = ΔI_L / √12Usually small; matters for electrolytics.
Output rippleΔV_out ≈ ΔI_L·ESR + ΔI_L/(8·f_sw·C_out) + ESL·V_in/LCapacitive term dominates with MLCCs; ESR term with polymer/electrolytic; ESL term shows as edge spikes.
Input rippleΔV_in ≈ I_out·D(1−D)/(f_sw·C_in) + I_pk·ESRDrives conducted EMI and upstream filter size.
LC double polef_LC = 1 / (2π√(L·C_out))Key frequency for voltage-mode compensation.
ESR zerof_ESR = 1 / (2π·ESR·C_out)MHz with MLCC (irrelevant); kHz with electrolytic (helps phase, hurts ripple).
CCM / DCM boundaryI_out,crit = ΔI_L/2Below this load, DCM (if diode or diode emulation).
Stored energyE_L = ½·L·I_pk²Proxy for inductor volume.
Bootstrap capC_boot ≥ 10 × Q_g,HS / ΔV_bootTyp. 0.1 µF; HS gate needs refresh time, so Dmax < 100%.
Soft-start inrushI_inrush = C_out·V_out / t_ss + I_loadKeep under current limit and upstream fuse/eFuse limits.

03Loss mechanisms, complete list

Efficiency η = Pout/(Pout + ΣPloss). Losses fall into three groups that scale differently with load. Knowing which group dominates at the operating point tells you which parameter to change.

Conduction: scales with I²Switching: scales with Vin·I·fswFixed: scales with fsw, not load
LossEquationScales withMain levers
HS conductionI_out²·D·(1+r²/12)·R_DS(on),HS(T_j)I², D, TjLower RDS(on) (bigger die, but more Qg), higher VGS, cooler junction
LS conductionI_out²·(1−D)·(1+r²/12)·R_DS(on),LS(T_j)I², 1−DAt low D this is the bigger conduction term; pick LS for lowest RDS(on)
HS V-I overlap½·V_in·f_sw·(I_v·t_on + I_pk·t_off)Vin, I, fswLow Qgd + Qgs2, strong driver, low Rg, low common-source inductance
t ≈ (Q_gd + Q_gs2)/I_g ; I_g,on = (V_drv − V_pl)/(R_drv + R_g)Turn-off current is the plateau voltage divided by pull-down resistance, so a low-Vth FET turns off slowly.
Coss charge≈ ½·Q_oss·V_in·f_sw (per hard-switched node)Vin, fswLow Qoss; soft switching (ZVS) recovers it. Grows fast at 48 V
Reverse recoveryQ_rr·V_in·f_sw (+ extra HS turn-on loss)Vin, fsw, I, di/dtShort dead time, Schottky-integrated LS, GaN (Qrr = 0). Also a ringing source
Dead-time conductionV_SD·f_sw·(I_v·t_d1 + I_pk·t_d2)I, fsw, tdeadAdaptive or predictive dead time; GaN's 2–3 V reverse drop makes this matter more
Gate drive(Q_g,HS + Q_g,LS)·V_drv·f_swfsw, VdrvLower Qg, optimal Vdrv
Driver supply (LDO)(Q_g,HS + Q_g,LS)·f_sw·(V_in − V_drv)Vin, fswAt 48 V the internal LDO burns ~9× the gate power. Feed VCC from Vout or an aux rail (EXTVCC pin)
Inductor copper DCI_L,rms²·DCR(T)I², temperature (+0.39%/°C Cu)Bigger wire, fewer turns, flat wire, larger body
Inductor copper AC(ΔI_L/√12)²·R_ac(f)ripple, fswSkin/proximity: litz, foil, or lower ripple. Usually minor below 1 MHz
Inductor coreP_v = k·f^α·ΔB^β · V_e (Steinmetz; iGSE for non-sine)ΔB (ripple), fswMaterial choice; ΔB = L·ΔIL/(N·Ae). Nearly load-independent in CCM
Input cap ESRI_Cin,rms²·ESRI², D(1−D)Parallel MLCCs; also sets cap self-heating
Output cap ESR(ΔI_L/√12)²·ESRrippleUsually negligible
PCB / sense resistorI_out²·(R_trace + R_sense)I²Copper weight, planes, DCR or RDS(on) sensing instead of a shunt
Controller quiescentI_q·V_inVinMatters for standby and light-load η
Snubber≈ C_snub·V_in²·f_swVin², fswUse only as much RC as the ringing needs; fix loop inductance first
Feedback dividerV_out² / (R_top + R_bot)fixedHigher R saves standby power but adds noise pickup

The two loss terms people forget

Qrr and Coss at high input voltage. Both scale with Vin and fsw and not with load, so on a 48 V bus they can exceed the conduction losses. In the worked example below they are about a third of the total. That is the core argument for GaN on 48 V rails.

Gate drive taken linearly from Vin. Qg·fsw·Vin, not Qg·fsw·Vdrv. A bias rail fed from Vout recovers most of it.

04Why the efficiency curve looks the way it does

Three regions

  • Light load: fixed losses (gate drive, Coss, core, Iq, circulating current in FCCM) dominate. Pout is small, so η collapses toward zero.
  • Peak: occurs roughly where load-proportional switching plus fixed losses equal the I2R losses. For loss = a + b·I + c·I², η peaks at I = √(a/c).
  • Heavy load: I2R dominates and rises with temperature (RDS(on) +40–60% hot), so η falls and can run away thermally.

Moving the peak

  • Peak too far right (poor light load): reduce fixed loss. Lower fsw, lower-Qg FETs, PFM/skip mode, diode emulation, lower core-loss material.
  • Peak too far left (poor full load): reduce c. Lower RDS(on), lower DCR, heavier copper, multiphase.
  • Phase shedding in multiphase drops phases at light load, keeping each active phase near its peak.
  • Gate-voltage scaling: lower Vdrv at light load cuts gate loss; higher Vdrv at heavy load cuts RDS(on).
Device FOMFor a given technology, RDS(on)·Qg and RDS(on)·Qgd are roughly constant. Doubling die area halves RDS(on) and doubles charge. The best high-side die makes its conduction loss roughly equal to its switching loss; at low D, the high side wants a small fast die and the low side wants a large low-resistance die.

05Parameter impact matrix

Effect of increasing each parameter, all else held. ▲ better, ▼ worse, ◆ depends / trade-off, — little effect.

Increase…EfficiencyOut rippleTransientSizeEMINotes
fsw▼▲▲▲ smaller L, C◆Switching, Qrr, Coss, gate, core losses scale with f. Higher f moves harmonics up but makes min on-time harder. Automotive: avoid 530 kHz–1.8 MHz AM band.
L◆▲▼ slew-limited▼▲Lower ripple cuts RMS and core loss but raises DCR for the same size. Slower current slew means more Cout for transients.
Cout—▲▲▼—Lowers fLC, so crossover and compensation shift. Watch DC-bias derating on MLCCs.
Cin▲ slight—▲▼▲Lowers input ripple and ESR heating; must meet RMS current. Can interact with input filter (damping).
Vin▼▼◆—▼Switching, Coss, Qrr grow; ripple grows; D shrinks toward min on-time. Faster load-application slew.
Vout (higher D)▲ usually◆◆——Same I, more Pout, fixed losses amortized. Ripple ∝ Vout(1−D) peaks at D = 0.5.
Iout◆ peak then ▼———▼See efficiency curve. Thermal limits set the ceiling.
Ripple ratio r◆▼▲▲ smaller L▼Higher r: smaller L, faster response, more RMS, core and turn-off loss, earlier DCM.
RDS(on)▼ heavy load——▲ smaller die—Lower RDS(on) brings higher Qg, Coss; optimize per FOM.
Qg, Qgd▼ light load / high f———▲ slower edgesSlower edges ease EMI but cost loss.
Qrr▼———▼Recovery current spike drives switch-node ringing.
Dead time◆———◆Too short: shoot-through. Too long: diode loss and Qrr. Optimal is a few ns more than the turn-off delay.
Gate drive V◆———▼ faster edgesLower RDS(on) vs Qg·V loss. GaN: hard 6 V limit.
Gate resistor Rg▼———▲Tunes dv/dt and ringing. Split turn-on/turn-off with a diode.
Inductor DCR▼——▲ smaller part—Also usable as a lossless current sense (RC matched to L/DCR).
Cap ESR▼ slight▼▼——But ESR zero helps phase in VMC and provides ripple for COT.
Loop crossover fc——▲▲ less Cout—Limited to ~fsw/10 (VMC) or fsw/5–/6 (PCMC). Too high: noise and jitter.
Hot-loop inductance▼▼ spikes——▼Overshoot V = L·di/dt eats voltage margin; ringing at 1/(2π√(Lloop·Coss)).
Common-source inductance▼———◆Negative feedback on VGS slows switching. Kelvin-source packages fix it.
Ambient / Tj▼————RDS(on) and DCR rise; ferrite core loss has a minimum near 80–100 °C.
Phases (N)▲ heavy load▲ cancellation▲◆▲Effective ripple frequency N·fsw; Cin RMS falls; adds controller and current-sharing complexity.

06Duty-cycle limits: minimum on-time and dropout

Minimum on-time (high Vin/Vout)

  • Required ton = Vout/(Vin·fsw). It must exceed the controller's ton,min (blanking + driver + propagation; commonly 30–100 ns for 60–100 V controllers) at Vin,max.
  • Max frequency for a ratio: fsw,max = Vout/(Vin,max·ton,min).
  • 48 V → 1 V at 1 MHz needs 20.8 ns: not practical in one stage. 48 V → 5 V at 2.2 MHz needs 47 ns: at the edge for most parts, and worse at a 60 V transient.
  • Violating it causes pulse skipping, subharmonic behavior, rising ripple, and loss of regulation. Some controllers fold back frequency automatically.
  • Peak current-mode controllers need leading-edge blanking, which adds to ton,min; valley current mode avoids sensing during the short on-time.

Maximum duty and dropout (low Vin)

  • Dmax is set by toff,min (bootstrap refresh, valley sensing): Dmax = 1 − toff,min·fsw.
  • Dropout Vin,min ≈ (Vout + I·(RLS+DCR))/Dmax + I·(RHS − RLS).
  • Automotive cold crank or a sagging battery bus drives the converter into dropout. Some controllers extend the on-time (frequency foldback) or support 100% duty with a charge-pumped high side.
  • For a robot on a 48 V battery, check Vin at end of discharge, under motor regeneration (overvoltage), and during hot-plug transients.

07Control methods and compensation

MethodPlant seen by the loopCompensatorStrengthsWeak points
Voltage mode (VMC)LC double pole at fLC, Q set by load and ESR; 180° phase drop; ESR zeroType III (two zeros near fLC, poles at fESR and fsw/2)Fixed frequency, good noise immunity, works at very low D, easy multiphase syncHarder to compensate; gain ∝ Vin unless feed-forward; no inherent cycle current limit
Peak current mode (PCMC)Single pole fp ≈ 1/(2π·Rload·Cout), ESR zero, double pole at fsw/2Type IIEasy compensation, inherent cycle-by-cycle limit, line rejection, natural current sharingSubharmonic oscillation at D > 0.5 without slope compensation; leading-edge blanking raises ton,min; noise sensitive at light load
Valley current modeAs PCMC, mirror imageType IIGood for low D (senses during long off-time)Subharmonic at D < 0.5 without slope comp; limits valley, not peak
Constant on-time (COT) / D-CAPRipple-based, no error amp in classic formNone or minimalVery fast transient response; natural PFM at light load; no compensation networkFrequency varies (adaptive ton helps); needs ripple: ESR·Cout > ton/2 or ripple injection with MLCCs; DC offset from ripple
HystereticComparator with bandNoneFastest, simplestVariable frequency, EMI spectrum spreads with load
Digital (PMBus)Any of the above, sampledPID/IIRTelemetry, programmability, adaptive dead time, non-linear transient boostADC quantization (limit cycling), delay, firmware qualification

Stability rules of thumb

  • Crossover fc: ≤ fsw/10 for VMC, fsw/5 to fsw/10 for PCMC.
  • Phase margin 45–60° (above 60° gets sluggish; below 45° rings). Gain margin ≥ 10 dB.
  • Slope compensation in PCMC: Se ≥ ½·Soff = ½·(Vout/L)·Ri for D up to 1; Se ≈ Soff gives Q ≈ 0.64 at the fsw/2 pole for any D. Too much slope comp turns PCMC back into VMC.
  • The buck has no right-half-plane zero (boost and buck-boost do), which is why its crossover can go much higher.
  • Ceramic Cout and DC-bias derating move fLC up by √(nominal/effective). Compensate with effective capacitance at operating voltage and temperature.

DC accuracy budget

  • Reference tolerance (0.5–1% typical over temperature).
  • Divider ratio error: two 0.1% resistors give ≈ ±0.2%·(1 − Vref/Vout)·2.
  • Error-amp offset and feedback-pin bias current × Rtop.
  • Load regulation (finite DC gain; droop if AVP used), line regulation.
  • Ripple and transient overshoot add on top of DC error. A ±3% rail with ±1% DC error leaves ±2% for ripple plus transient.
  • Remote sense compensates distribution drop at high current.

08Load-transient response

Two limits apply. The loop limits how fast the controller reacts; the inductor limits how fast current can change even when the controller responds immediately. Whichever is slower sets the overshoot.

Loop-limited deviationΔV ≈ ΔI / (2π·f_c·C_out)Doubling fc halves deviation, or halves the Cout needed.
Inductor slew, load step updI/dt = (V_in·D_max − V_out)/LFast when Vin ≫ Vout.
Inductor slew, load releasedI/dt = −V_out/LSlow at low Vout; the unload overshoot is often the binding constraint.
Overshoot (unload, L-limited)ΔV ≈ L·ΔI² / (2·C_out·V_out)Energy in L dumped into Cout.
Undershoot (step, L-limited)ΔV ≈ L·ΔI² / (2·C_out·(V_in·D_max − V_out))Plus ESR·ΔI and ESL·di/dt spikes.
Target impedanceZ_target = ΔV_allowed / ΔI_stepOutput impedance must stay below this from DC past the load's di/dt bandwidth; decoupling covers what the loop can't.

09Component selection

MOSFETs

  • VDS rating: ≥ 1.25–1.5 × Vin,max including transients and switch-node overshoot. 48 V nominal (60 V max) bus: 80–100 V parts.
  • High side: low Qgd, Qsw, Qoss; moderate RDS(on). Low D means short conduction.
  • Low side: lowest RDS(on), low Qrr, high Cgs/Cgd ratio and Vth to resist Miller (dv/dt) turn-on when the high side fires.
  • Check SOA for hot-swap/short events, avalanche rating for inductive kicks, and RDS(on) at your actual VGS and Tj, not the headline number.
  • Package: low parasitic inductance (dual-cool, source-down, Kelvin source), thermal path to board or heatsink.

Gate driver

  • Peak source/sink current sets transition time. Separate turn-on/turn-off paths tune dv/dt.
  • Bootstrap diode Qrr and Vf; bootstrap UVLO on the high side.
  • Propagation-delay matching and dead-time control (fixed, adaptive by sensing VGS/VSW, or predictive).
  • dv/dt immunity (CMTI) of the level shifter, 50–100+ V/ns for GaN.

Inductor

  • Isat > Ipk at max load, max Vin, max temperature, plus current-limit tolerance. Saturation spec definitions differ (−10%, −20%, −30% L drop); read the curve.
  • Irms (thermal) rating is for ~40 °C rise; derate for ambient.
  • Saturation shape: ferrite saturates hard (L collapses); powder and metal-composite saturate softly and tolerate overload but have higher core loss at high f.
  • Core loss vs DCR trade within one footprint. Use vendor loss calculators (they include AC and core loss for your exact waveform).
  • Shielded construction for EMI; note L tolerance (±20%) in ripple and loop calculations.
  • Coupled inductors in multiphase reduce per-phase ripple while keeping fast transient response.

Capacitors

  • MLCC DC-bias derating: X5R/X7R class II can lose 50–80% of capacitance near rated voltage, more in small case sizes. Use the vendor's DC-bias curve. Add temperature and aging.
  • Input: rated for ICin,rms; voltage rating ≥ 1.5–2× bus for derating; place a small 0402/0603 high-frequency cap right at the FETs.
  • Output: MLCC for low ESR/ESL; polymer or tantalum-polymer for bulk energy at low cost per µF; aluminum electrolytic ESR rises sharply in cold.
  • Flex-crack risk on large MLCCs at board edges; use soft-termination or split into smaller parts in automotive and robot vibration environments.

Current sensing

  • Shunt (accurate, lossy), DCR sense (lossless, ±7–10% with Cu tempco unless compensated), RDS(on) sense (lossless, poor accuracy), SenseFET mirror in integrated stages.

10Silicon MOSFET vs GaN HEMT in a buck

Parameter100 V Si trench100 V e-mode GaNEffect on the buck
QrrTens of nCZero (no body diode)Removes recovery loss and the ringing it excites; the largest single gain at 48 V
Qg at similar RDS(on)BaselineSeveral times lowerGate loss and transition time fall; higher fsw becomes practical
QossBaselineRoughly half or lessLower Coss loss
Reverse conduction in dead timeBody diode ~0.7–0.9 V~1.5–3 V (depends on VGS,off)Dead-time loss per ns is 2–3× higher; keep dead time short (few ns)
Gate rating±20 V, Vth 2–4 VTyp. −4/+6 V abs max, Vth ~1.1–1.7 VTight gate regulation; Miller turn-on risk; often a negative or 0 V off-state with Kelvin source
AvalancheRatedNo avalanche capabilityNeed voltage margin; clamp overshoot by layout
Edge rate5–20 V/ns typical50–100+ V/nsLayout loop inductance and CMTI become first-order concerns; EMI filter design shifts higher in frequency
PackagePowerPAK, LFPAK, TOLLChip-scale / LGA, very low inductanceAssembly and underfill, solder-joint reliability, thermal path through board
Dynamic RDS(on)NoCharge trapping raises RDS(on) after high-V blockingCheck vendor data at your Vin and fsw

11Thermal design

  • Tj = Ta + PD·θJA (or through θJC + θCS + θSA with a heatsink). Datasheet θJA uses a JEDEC board and rarely matches yours; use ψJT with a thermocouple or IR to back out Tj.
  • RDS(on) rises ~1.4–1.6× from 25 to 125 °C, so conduction loss and temperature feed back. Iterate the loss calculation at the computed Tj until it converges; if it doesn't, the design has thermal runaway.
  • Copper DCR tempco +0.39%/°C. Inductor hot-spot is often the hottest part on the board.
  • Spread heat: 2 oz copper, thermal-via arrays under exposed pads (filled or tented), inner planes as heat spreaders.
  • Distribute loss: when one FET dominates, a different die split or a second phase spreads heat better than a bigger heatsink.
  • Derating: common practice keeps Tj ≤ 125 °C (Si, automotive 150 °C parts), capacitor core temperature within ripple rating, inductor within its insulation class.
  • Robot enclosures are often sealed for ingress, so convection is limited; conduction to the chassis is the main path.

12Layout

Layout is a design parameter. The same schematic can differ by several points of efficiency and 20 dB of EMI depending on placement.

Power stage

  • Minimize the hot loop (Cin–Q1–Q2). Put the high-frequency input cap on the same layer right at the FET pins; use a vertical loop with a return plane on layer 2 directly underneath. Targets well under 1 nH for GaN.
  • Small switch node: just big enough for current and heat. It is a high-dv/dt antenna and couples capacitively into everything near it.
  • Inductor and output loop carry DC plus ripple; it is less critical but keep it compact.
  • Keep the switch node away from feedback, compensation, current-sense and clock traces; never route them under the inductor or SW copper.

Control and sensing

  • Gate loop: driver close to FETs; gate and return as a tight pair; Kelvin source return.
  • Kelvin sense: current-sense lines differential from the shunt pads; remote Vout sense at the load.
  • Quiet analog ground for the controller, tied to power ground at one point near the controller's PGND pin (or a solid plane with careful component placement).
  • Feedback divider close to the FB pin (high-impedance node short); its top connection runs to the regulation point.
  • Bootstrap cap directly at BOOT–SW pins.

13EMI / EMC

Noise sources

  • Differential mode, conducted: trapezoidal input current at fsw and harmonics. Handle with Cin and an input LC (π) filter.
  • Common mode: switch-node dv/dt into parasitic capacitance to chassis or heatsink: ICM = Cpar·dv/dt. 10 pF at 50 V/ns is 0.5 A peak. Handle with small SW area, shielding, CM chokes, Y-caps.
  • Radiated: hot-loop ringing at fring = 1/(2π√(Lloop·Coss)); 1 nH with 500 pF rings at ≈ 225 MHz. Also cable radiation from CM current.
  • Magnetic near-field from unshielded inductors coupling to sensors or harnesses.

Mitigation

  • Layout first (above). Then edge-rate control: gate resistor, split Rg, bootstrap resistor to slow only the high-side turn-on.
  • RC snubber across the low-side FET: Cs ≈ 3–4 × Coss, Rs ≈ √(Lloop/Coss) (measure ring frequency, add known C, solve for L). Loss ≈ Cs·Vin2·fsw.
  • Spread spectrum (±5–10% dithering) lowers peak and quasi-peak readings; mind the loop and any audio/sensor bands.
  • Frequency planning: for CISPR 25, run below 530 kHz or above 1.8 MHz to clear the AM broadcast band; keep harmonics out of sensor bands (radar IF, GNSS L1 at 1575 MHz, capacitive sensing frequencies, CAN/Ethernet).
  • Synchronize multiple converters to one clock (with phase shift) to avoid beat frequencies that appear as low-frequency ripple and tones.

Input filter stability (Middlebrook)

A regulated converter draws constant power, so it looks like a negative resistance at its input: Rin = −Vin2/Pin below the loop crossover. An undamped LC input filter can oscillate with it. Keep the filter's output impedance well below |Rin| at all frequencies, especially at the filter's resonance. Damp it with an electrolytic's ESR or an RC branch (R ≈ √(Lf/Cf), Cd ≈ 4 × Cf). At 48 V and 100 W, |Rin| ≈ 23 Ω; at 12 V input the same power gives 1.4 Ω, which is why low-voltage high-power filters are harder.

14Protection, start-up and operating modes

FeatureWhat it doesDesign parameters
UVLO / enableKeeps the converter off until Vin can sustain regulation; hysteresis prevents chatterRising/falling thresholds via EN divider; set above dropout Vin,min
Soft-startRamps reference so inrush stays below current limittss; Cout including downstream load caps
Pre-bias start-upPrevents the low side from discharging a rail already powered by another sourceRequired for sequenced or redundant rails
OvercurrentCycle-by-cycle peak or valley limit; then hiccup or latch-offLimit above Ipk max with tolerance, below Isat; hiccup duty keeps short-circuit dissipation low
Short-circuitAt Vout ≈ 0, required on-time is near zero, so the min on-time lets current run awayValley limit, frequency foldback or hiccup handle it
OVP / UVPLatches or turns on LS to crowbar on output faultThresholds relative to Vref; coordinate with downstream absolute max
Thermal shutdownDie temperature trip with hysteresisOnly protects the controller die, not external FETs; add NTC if needed
Power goodOpen-drain flag when Vout is in windowDelay and window; drives sequencing and resets
Light-load modeFCCM (fixed f, sinks current), PFM / skip / burst (high light-load η, variable spectrum), diode emulationChoose per EMI and efficiency priorities; some parts allow ultrasonic mode to keep f > 20 kHz
Sync / interleaveLock to external clock; phase shift between convertersReduces input RMS and beat tones
Tracking / sequencingRails ramp in order or ratiometricallyFPGA/SoC rail requirements

15Architecture options when a single buck isn't enough

OptionWhen it helpsCost
Multiphase interleaved buckHigh current (> 20–30 A), fast transients, thermal spreading. Ripple cancels fully at D = k/NController, current sharing, more parts
Two-stage (48 → 12 → 1 V)Large step-down; each stage runs at a sensible duty and its own optimal fswEfficiencies multiply (0.97 × 0.92 ≈ 0.89)
Fixed-ratio bus converter (DCX, switched-cap)48 → 12 V at 98%+ unregulated, followed by regulated POL bucksNo regulation; output tracks input
Three-level / flying-capacitor buckHalves switch voltage stress, doubles effective ripple frequency, smaller inductorFlying-cap balancing, more switches
Hybrid switched-cap buckLarge ratios in very small volume (data center, robotics compute)Complex control, start-up
Tapped-inductor buckExtends duty at large ratiosLeakage-inductance spikes
Power module / integrated stageSchedule, layout risk, sizePrice, less freedom in thermal and EMI tuning

16Worked example: 48 V → 12 V, 8 A, 400 kHz

A plausible auxiliary rail on a robot's 48 V bus (sensors, small compute, fans). Representative 100 V silicon values, junction assumed hot (RDS(on) × 1.4). Vin range 36–58 V.

Power stage

D (nominal)0.25
Target r0.35
L (calc 8.04 µH) → choose8.2 µH
ΔIL at 48 V2.74 A
ΔIL at 58 V2.90 A
Ipk / Ivalley9.37 / 6.63 A
IL,rms8.04 A
Isat required (with 20% margin + CL)≥ 12 A
ICin,rms3.46 A
Cout effective (after DC bias)40 µF
Ripple, capacitive term21 mV p-p
fLC8.8 kHz
Crossover target (fsw/10)40 kHz
ton at 58 V517 ns ✓
Unload 4 A step, L-limited overshoot≈ 137 mV

Loss budget (48 V, 8 A, hot)

LossW%
HS V-I overlap (5 ns edges)0.7721.5
LS Qrr (40 nC)0.7721.5
Inductor DCR (8 mΩ)0.5214.5
Coss (Qoss 40 nC)0.3810.8
LS conduction (4 mΩ)0.277.6
Inductor core0.205.6
PCB copper (3 mΩ)0.195.4
HS conduction (6 mΩ)0.143.8
Dead time (2 × 20 ns)0.102.9
Gate drive (50 nC, 5 V)0.102.8
Controller Iq0.102.7
Cin ESR0.041.0
Total3.57100
Efficiency (96 W out)96.4%
Reading the budgetOver half the loss is Vin-dependent switching (overlap, Qrr, Coss); conduction in the FETs is under 12%. Spending money on lower RDS(on) would barely move efficiency. The useful moves are: a low-Qrr or Schottky-integrated low side, a faster high side or GaN, a lower-DCR inductor, or a lower fsw if size allows. The calculator in section 18 lets you test each; the GaN preset lands near 98.0% with the same inductor and copper.

17ROHM app-note loss model (64AN035E)

ROHM's application note Efficiency of Buck Converter (64AN035E Rev.004, Nov 2022) breaks a buck's loss into twelve closed-form terms and works them for a 12 V → 5 V, 3 A, 1 MHz converter with small integrated MOSFETs. It is the low-voltage, high-frequency counterpart to the 48 V example in section 16, and the two together show how the dominant loss moves with input voltage.

Example conditions

VIN / VOUT / IOUT12 V / 5.0 V / 3.0 AfSW / L / DCR1.0 MHz / 4.7 µH / 80 mΩ
RON-H / RON-L100 / 70 mΩtr-H / tf-H4 / 6 ns
tr-L / tf-L2 / 2 nsDead time tDr / tDf30 / 30 ns
Body diode VD0.5 VIRR / tRR0.3 A / 25 ns
CDS = CGD (each FET)40 pFQg-H = Qg-L / Vgs1 nC / 5.0 V
IC current ICC1.0 mAESRIN / ESROUT3 / 1 mΩ
Derived: D / ΔIL0.417 / 0.62 ADerived: IP / IV3.31 / 2.69 A

The twelve terms

TermROHM equationSyncAsync% of sync
Inductor DCR[I_OUT² + (I_P−I_V)²/12]·DCR723 mW723 mW39.7
HS conduction[I_OUT² + (I_P−I_V)²/12]·R_ON-H·V_OUT/V_IN376 mW376 mW20.7
LS conduction / diode conduction[…]·R_ON-L·(1−V_OUT/V_IN)  |  I_OUT·V_F·(1−V_OUT/V_IN)369 mW875 mW20.3
HS switching½·V_IN·I_OUT·(t_r-H + t_f-H)·f_SW180 mW180 mW9.9
Dead timeV_D·I_OUT·(t_Dr + t_Df)·f_SW90 mW—4.9
Reverse recovery½·V_IN·I_RR·t_RR·f_SW45 mW45 mW2.5
IC operationV_IN·I_CC12 mW12 mW0.7
Gate charge(Q_g-H + Q_g-L)·V_gs·f_SW  or  (C_GS-H + C_GS-L)·V_gs²·f_SW10 mW5 mW0.5
Input cap ESR[I_OUT·√((V_IN−V_OUT)·V_OUT)/V_IN]²·ESR_IN6.6 mW6.6 mW0.4
COSS½·(C_DS-H + C_GD-H)·V_IN²·f_SW5.8 mW5.8 mW0.3
LS switching½·V_D·I_OUT·(t_r-L + t_f-L)·f_SW3 mW—0.2
Output cap ESR[ΔI_L/(2√3)]²·ESR_OUT0.03 mW*0.03 mW*0.0
Total loss1.82 W2.23 W100
Efficiency (15 W out)η = V_OUT·I_OUT / (V_OUT·I_OUT + P)89.2%87.1%

Every value above was recomputed from the stated conditions and matches the note, with one exception: *the note lists 0.5 mW for the output capacitor; its own formula with these values gives 0.03 mW. Negligible either way. The note gives the loss totals but not the efficiencies; those are computed here.

Conduction (I²R)Switching (VIN·I·f)Fixed
Inductor DCR0.723 W · 40%
HS conduction0.376 W · 21%
LS conduction0.369 W · 20%
HS switching0.180 W · 10%
Dead time0.090 W · 5%
Reverse recovery0.045 W · 2%
IC + gate0.022 W · 1%
COSS + LS sw + caps0.016 W · 1%

Reading the result

  • I2R is about 81% of the loss. With 70–100 mΩ integrated FETs and an 80 mΩ inductor, conduction swamps everything at 3 A. The single best fix is a lower-DCR inductor: halving DCR saves 0.36 W, worth about 2 points of efficiency.
  • VIN-driven terms are small at 12 V. COSS loss scales with VIN2: 5.8 mW here, but the same capacitance at 48 V would be 16× larger. Switching and recovery scale with VIN. That is why section 16's 48 V design is switching-dominated while this one is conduction-dominated.
  • Dead time is 5% here. 60 ns of body-diode conduction per cycle at 1 MHz is 6% of the period. Halving the dead time saves 45 mW.
  • Synchronous vs diode: replacing the low-side FET with a 0.5 V diode raises the low-side loss from 0.37 to 0.88 W, net +0.41 W after the dead-time and LS switching terms drop out. At 5 V out the diode costs about 2 points; at lower VOUT (more time in the low side) the gap widens.

How the note's sweeps trend

ConditionDominant lossRemedy
High IOUTFET and inductor conductionLower RON and DCR, accepting larger parts and more capacitance
Low IOUTSwitching, COSS, gate, ICLower fSW, smaller FETs, low-Iq control
High fSWSwitching, recovery, COSS, dead timeLow-capacitance fast FETs, shorter dead time
Low VOUT (low D)Low-side conductionLowest-RON low side; synchronous over diode
High VOUT (high D)High-side conductionLower high-side RON; diode penalty shrinks

How the ROHM model differs from section 03

ItemROHM noteThis sheetWhen it matters
Switching currentIOUT at both edgesIV at turn-on, IP at turn-offEqual for symmetric edges; differs when tr ≠ tf or ripple is large
Dead time currentIOUTIV and IP per edgeHigh ripple ratio, or negative valley at light load
Reverse recoveryTriangle ½·IRR·tRR, i.e. Qrr ≈ 3.75 nCQrr·Vin·fswSame physics; datasheets usually give Qrr directly
COSS½·C·VIN2, high side only; low side treated as zero-voltage switched½·Qoss·Vin per hard-switched nodeUse charge or energy-equivalent Co(er): COSS is strongly non-linear with VDS
Inductor core and AC copperNot coveredSteinmetz / iGSE, RacFerrite at MHz, or high ripple; often 5–15% of loss
Gate drive supplyQg·Vgs·fAdds LDO loss Qg·f·(Vin − Vdrv)High VIN with internal bias regulator
TemperatureRON, DCR at given valuesHot factor on RDS(on)Always; iterate to the operating Tj
PCB copperNot coveredI2·RtraceHigh current
Use in the interviewContrast the two worked designs in one sentence: at 12 V and 3 A, buck loss is mostly I²R and the inductor is the first thing to fix; at 48 V and 8 A, most of the loss is Vin-driven switching, recovery and Coss, which is the case for GaN. The "ROHM note 12 → 5 V" preset in the calculator reproduces this example (1.82 W, 89.2%) so you can sweep it live.

18Loss calculator

Forced-CCM synchronous buck, first-order models from section 03. The ROHM preset reproduces the section 17 app-note example to within 3 mW. Results are estimates; vendor models and bench data govern.

Operating point

Switches

Passives and fixed

–
Efficiency
–
Total loss
–
Duty / ton
–
ΔIL (r)
–
Ipk / Ivalley
–
ICin,rms
ConductionSwitchingFixed

Efficiency vs load (same parts, forced CCM)

19Bench validation and interview Q&A

Measuring it right

  • Efficiency: four-wire voltage sense at the converter terminals, calibrated shunts or DMMs on both sides, thermal soak 15–30 min per point, sweep load and Vin. A 0.5% meter error on each of V and I is ±1% on η.
  • Output ripple: 20 MHz bandwidth limit, AC coupled, tip-and-barrel or spring ground across the output cap. A long ground lead adds fake spikes.
  • Switch node: high-bandwidth passive or isolated probe with the shortest ground; ringing amplitude and frequency give VDS margin and Lloop.
  • Gate waveforms: high side needs an isolated (optically isolated for GaN) probe.
  • Loop gain: injection transformer and 10–50 Ω resistor in the feedback path; measure at min/max Vin, load, temperature.
  • Transient: electronic load or a MOSFET step at the slew rate the real load produces.
  • Thermal: IR camera at full load and max ambient; thermocouples on inductor and FETs.
  • EMI: pre-scan with LISN and near-field probes before chamber time.

Likely questions

Efficiency is lower than calculated. Where do you look?

Measure, don't guess. IR image first: the hottest part points to the loss. Compare light-load η (fixed losses) with full-load η (I²R). Check switch-node ringing (Qrr, snubber), dead time on the scope, actual RDS(on) at the real VGS, driver bias supply source, inductor saturation (peaky current waveform), and whether the controller entered PFM or is skipping pulses.

Why does higher fsw hurt efficiency, and why do it anyway?

Switching, Qrr, Coss, gate and core losses scale with f. Higher f shrinks L and C, raises the achievable crossover (faster transients, less Cout), and can move harmonics out of a protected band. With GaN the per-cycle loss is low enough that 1–2 MHz at 48 V becomes reasonable.

How do you pick the inductor?

Choose ripple ratio (0.2–0.4) at Vin,max, compute L, then select a part with Isat above the peak at current limit and max temperature, Irms rating with derating, and the best DCR-plus-core-loss trade for your frequency, checked in the vendor loss tool. Prefer soft saturation if overloads are possible.

What is subharmonic oscillation?

In peak current mode above 50% duty, a perturbation in inductor current grows each cycle because the down-slope is steeper than the up-slope in the error map. It appears as alternating wide and narrow pulses at fsw/2. Adding a compensating ramp (Se ≥ half the down-slope) restores stability.

How do MLCCs mislead you?

DC-bias derating can remove most of the capacitance at the operating voltage, so ripple is higher and fLC higher than calculated, which shifts the compensation. Also temperature, aging, and acoustic noise (piezo effect) in PFM.

Buck from 48 V to 0.8 V for an SoC. How?

The required on-time at any useful frequency is below what a controller can do, and a single stage loses badly to switching loss. Use 48 → 12 V (DCX or buck) then multiphase POL bucks, or a hybrid switched-cap or 48 V direct-conversion stage. Compare total efficiency and transient performance, not the first stage alone.

What sets the voltage rating of the FETs?

Vin,max including transients (load dump, regen, hot-plug ringing) plus switch-node overshoot from Lloop·di/dt, with margin: 25–50% for Si, more for GaN, which has no avalanche rating.

The converter sings audibly at light load. Why?

PFM or burst mode bursts at audio frequencies; MLCCs and the inductor vibrate. Use ultrasonic mode or FCCM, soft-termination or film caps, or a different inductor construction.

How does a buck interact with a motor drive on the same bus?

Motor PWM produces large ripple and steps on the bus; regen can raise the bus above nominal. The buck needs line-transient rejection (current mode helps), VDS margin for regen, an input filter that stays stable against the negative input impedance, and a switching frequency planned against motor PWM harmonics and sensor bands.